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Selective Area Growth (SAG) is a technique
for bandgap engineering, which allows for growing different wavelength
regions across a single wafer with one run. In essence, the process starts
with defining a dielectric mask on the surface of a plain wafer. Due to the surface
migration and gas-phase diffusion, the material between the patterns
have different growth rate and composition, than the material far from
them. Thus, the
geometry and the dimension of this mask determine the spectral properties of the
semiconductor material. The following picture shows 6 InGaAsP QWs grown
between the patterns as well as the interface region formed close to the
dielectric mask.

The growth rate between the
patterns linearly increases with increasing the mask width. The higher
growth rate, the thicker the QWs, and thus the smaller the bandgap. The
following is an example of 6 QWs grown at the same time in four different
regions with different mask widths, w.

SAG technique is a very
powerful method enabling the monolithic integration of devices with
different spectral properties in a PIC. Integration of active with passive
waveguides, active devices with mode converters, optical amplifiers with
electroabsorption modulators, broad spectrum light emitting diodes, laser
arrays for WDM systems, multi-section optical equalizers and many
others are possible.
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A presentation
SAG technique is a very powerful
method enabling the monolithic integration of devices with different
spectral properties. This presentation contains more
information on the subject. A PDF version is also available.
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Photo
gallery
See a collection of SEM photos showing the
properties of the SAG techniques. Example pictures from a SAG two-sections
device are presented.
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List of related
publications
This page contains a list of publications
related to the project. |
Group
Members participating in the research
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Kostadin
Djordjev
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Sangjun
Choi
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Seung
June Choi
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